You can summarize and chart product defects using Pareto's law to focus on the most often occurring defects. For example, you can create Pareto charts to monitor the following:
top defects
most occurring causes
most frequent repair types
You can chart quality results for any collection plan element. For example, you can chart the top defects entered for a particular production line this week.
You can chart quality results using Pareto charts. You can create Pareto charts from "scratch" or you can create them by copying settings from another chart, descriptive statistic view, or custom report. Copying settings allows you to view the same subset of data in different ways. See: Copy Settings.
You can save your chart settings so that you can recreate charts using the same settings. You can change these settings to create new charts. You can select only those results that are to be charted. When you are satisfied with your settings and record selection, you can view your chart. You can optionally export chart information for further analysis.
Navigate to the Pareto Chart window.
Choose the Copy Settings button. See: Copying Settings.
Enter missing information or change the copied information as required (See below).
You can change all copied settings except the collection plan.
Navigate to the Pareto Chart window.
Enter the Chart Name.
To save your chart parameters, you must enter a chart name.
Select the Collection Plan to chart.
If you are creating a chart, you can select any collection plan, even those that are no longer effective. If you are changing a chart, you cannot change the collection plan.
Optionally, enter the Chart Title.
The text you enter here is displayed at the top of the chart.
Select the X-axis Collection Element.
The X-axis of the chart (the horizontal dimension) is the primary collection element that you want to analyze. For example, for a top defects Pareto, choose Defect Code as the collection element for the X-axis.
The X-Axis Element can be any collection plan element. However, usually you should select a collection element that represents an attribute or reference collection element; for example, Defect Code, Cause Code, Department, or Item Category.
Select the Y-axis Collection Element.
The Y-axis of the chart (the vertical dimension) usually represents a quantity or count of occurrences.
Select the Y-axis Function.
If the X-axis collection element selected is a number, you can sum or count the values associated with that collection element. You can also choose to determine the minimum, maximum, or average of these values. For example, if the collection plan contains collection elements Defect Code and Quantity Defective, you can choose Defect Code for the X-axis element, Quantity Defective for the Y-axis, then select the sum function for the Y-axis. When sum is selected all the defective quantities for each defect code are added up and charted. See: Functional Grouping and Processing.
If the X-axis collection element you select is a character or date (for example, Defect Code), you must select count. For example, if you have a collection plan with collection elements Serial Number and Defect Code, you might assume a quantity of 1 for each serialized unit. In this case, you can select Defect Code as the X-axis and specify the chart to count all the occurrences for each defect code.
Enter the Top n Groups to display on the chart. For example, enter 5 to chart the top five defect codes.
Optionally, enter the chart Description.
The text you enter here is displayed at the top of the chart, under the chart title.
Navigate to the Show Results Where region of the Pareto Chart window. See: Finding Quality Results.
If you do not select which quality results to chart, all results associated with the collection plan are used.
Choose the View Chart button. The chart you created will display in a separate window.
Choose the Save Settings button if you want to save the inquiry settings.
Choose Export Results from the Tools menu. See: Exporting Quality Results.